Particles are widely encountered in every industry, either as raw ingredients or as a contamination. In this 30 minute webinar, we will focus on the characterization of particle contamination. We will discuss the approaches and methodologies for isolation and analysis of foreign particles found in different products, processes and manufacturing facilities.
During this webinar, we will present an overview of SEM-EDS, optical microscopy, FTIR and Raman spectroscopy for characterizing particles and particle contamination. Case study examples will be presented showing the various approaches to particle characterization. After attending this webinar, the attendees will have an understanding of the different techniques applied to particle characterization.
* Overview of particle characterization
* Overview of instruments used for particle characterization
* Application & case study examples for analyzing particle contamination
Rich Brown is an executive director and scientist at MVA Scientific Consultants. Rich’s expertise is in failure analysis, material analysis and microanalysis of small particles and contaminants using polarized light microscopy, infrared microspectroscopy, Raman spectroscopy, and scanning electron microscopy with energy dispersive X-ray spectrometry. Rich enjoys helping clients solve challenging issues with his micro-analytical expertise. His nickname is the “Particle Detective”. Rich developed his expertise in particle characterization over a 30-year career analyzing a variety of materials, including fibers, glass, paint, metals, polymers, nanoparticles and others. Rich has published his microanalytical work and interesting case studies in numerous peer reviewed journals and book chapters.