Capabilities
We specialize in particle and material characterization, particle size distribution, contamination analysis, product failure analysis, root cause analysis, and litigation support services. We also work with other analytical labs to provide wide range of testing services.
Scanning electron microscopy
Transmission electron microscopy
Micro-Fourier transform infrared spectroscopy
Polarized light microscopy
Scanning white light interference microscopy
Confocal Raman microscopy/spectroscopy
Scanning electron transmission microscope (STEM), at GA Tech
Focused ion beam (FIB), at GA Tech
X-ray diffraction (subcontracted)
Zeta potential (subcontracted)
BET surface area (subcontracted)
Liquid chromatography (subcontracted)
Metallurgy (subcontracted)
X-ray photoelectron spectroscopy (subcontracted)
A list of our current equipment and analytical instruments is available here: Instrument List
TRAINING COURSES
Fundamentals of Asbestos by Transmission Electron Microscopy
Foreign Particulate Analysis Training Course
Foreign Particulate Analysis Training Course