1991:36: Brown, Vander Wood
Microscope, Vol. 39
Abstract:
Almost anything can be examined by scanning electron microscopy (SEM) if the specimen has been adequately prepared. Non-conducting materials, however, require a thin conductive coating to obtain good SEM images.
Reprints of this publication are available upon request.
You may call us directly or contact us here: reprints.
Please reference article “1991:36: Brown, Vander Wood” in your request.