Contamination is an ongoing battle for every pharmaceutical company. When pharmaceutical manufacturers encounter foreign material contamination in products, they have to quarantine the product and investigate and identify the origin of the … [Read more...]
Particle Characterization Workshop – 2015 Southeastern Microscopy Society
Last week MVA Scientific Consultants and the Southeastern Microscopy Society (SEMS) collaborated to host a half-day Particle Characterization Workshop. The objective of the workshop was to teach industry professionals the approach we use … [Read more...]
Multilayer Thin Film Characterization
Thin film characterization can provide information about the number of layers present in a film and the thickness, composition, and structure of each layer. Thin film characterization can also be used to identify defects, … [Read more...]