Proceedings of the American Academy of Forensic Sciences, Annual Meeting, Feb 2008
The goal of this presentation is to present to the forensic community information about how Transmission Electron Microscopy (TEM) can be instrumental in forensic trace evidence analyses.
This presentation will impact the forensic science community by showing how TEM can be very useful in forensic trace evidence analysis due to its ability to analyze the morphology of small particles, gather elemental information on very small particles and determine the internal structure of small particles. This presentation will show the advantages of using TEM along with other microscopic techniques to characterize and identify particles, specifically nanoparticles, for forensic purposes.
Reprints of this publication are available upon request.
You may call us directly or contact us here: reprints.
Please reference article “2008:153:Hill” in your request.