Thin film characterization can provide information about the number of layers present in a film and the thickness, composition, and structure of each layer. Thin film characterization can also be used to identify defects, … [Read more...]
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Thin film characterization can provide information about the number of layers present in a film and the thickness, composition, and structure of each layer. Thin film characterization can also be used to identify defects, … [Read more...]
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