Particle Characterization Workshop


“Particle Characterization by Light Microscopy and Electron Microscopy”

This half-day workshop provides an analytical framework for particle characterization. Participants will have a “hands-on” opportunity to collect, manipulate, mount and analyze small visible particles (less than 1 millimeter) using the expertise and microscopes available at MVA Scientific Consultants.

The analysis approach uses polarized light microscopy (PLM), Fourier transform infrared microspectrophotometry (FTIR), confocal Raman microscopy (CRM) and scanning electron microscopy-energy dispersive x-ray spectrometry (SEM-EDS).

SEMS Workshop 2015

The workshop will focus on sample handling and how to efficiently route unknown particles through the analytical techniques available.

Microscopic analysis techniques will be applied to polymer, glass and metal particles that are typical of contamination found in manufactured products such as pharmaceuticals, medical devices, and packaging materials. The workshop is limited to 12 participants. No previous analytical experience is required.

Photos from the 2015 SEMS / MVA Scientific Consultants “Particle Characterization Workshop”


Workshop Date: TBD
Workshop Location:
MVA Scientific Consultants
3300 Breckinridge Boulevard
Suite 400
Duluth, GA 30096
Call Melissa Holman at 770.662.8509