SEM Analysis Testing Services

SEM Analysis Testing Services
SEM analysis testing services offered at our lab include:

  • Automated SEM particle analysis
  • Particle size distribution determination
  • Fractured surface analysis
  • Polymer cross-section analysis
  • Contamination analysis
  • Examination of pharmaceutical ingredients
  • SEM/EDS elemental mapping
  • Particle and surface morphology studies
  • Material characterization
  • High resolution SEM imaging
sem analysis of salt crystal
Salt Crystal
sem analysis of coating failure
Coating Failure
sem analysis of polymer
Polymer Fracture
sem analysis of pollen
sem analysis of minerals
Quartz Crystal
sem analysis of folded talc
Folded Talc
sem analysis of a diatom
sem analysis of contamination on medical device
Contamination on Medical Device
sem analysis of contamination on catheter
Contamination on Catheter
sem analysis of 3 month old toothbrush bristle
3 Month Old Toothbrush Bristle
sem analysis of new toothbrush
New Toothbrush Bristle
Electron microscopy image of metal particle
Metal Particle
Talc Particle Electron Microscope Image
Fly ash analyzed by electron microscopy
Fly Ash
SEM Analysis:
Video Overview by MVA

The scanning electron microscope (SEM) is one of the most powerful and useful tools for material analysis. SEMs use electrons rather than light waves to examine surfaces, permitting much greater magnification, resolving power and depth of field. SEM analysis provides us with high resolution imaging at magnifications up to 300,000X.

SEM analysis allows us to examine and characterize particles and nanoparticles, fracture surfaces, surface morphologies, composites and their constituents, and microstructures of prepared cross-sections.

With the addition of energy dispersive x-ray spectrometry (EDS), we can simultaneously determine the elemental composition and morphology of different materials.

Field Emission SEM

The Field Emission Scanning Electron Microscope (FE-SEM) is configured similarly to a conventional SEM, except that a field emission electron source is used, allowing higher resolution imaging, increased signal to noise ratio, and increased depth of field.

An FE-SEM source produces electrons by applying a high voltage to a very sharp point and extracting the electrons directly, only from the point. The coherence and very small diameter of this source increases the useful magnification of the SEM by a factor of ten.

To learn more: SEM/EDS Electron Microscopy Lab Services