Tim Vander Wood, our Executive Director, recently presented a poster on stack particle size analysis by microscopy at the Source Emission Society (SES) Conference. The poster was published in the SES newsletter this April, and we thought it would be beneficial to share it with you.
The use of scanning electron microscopy for stack particle size measurement is useful where stack geometry, cyclonic flow or moisture precludes the use of Method201A, and when the stacks are simply too clean to use gravimetric methods.
One of the most common questions that we get from prospects is “Do regulatory agencies accept results from microscopy particle size measurement?” The answer to that is yes. Our clients have submitted microscopy particle sizing data to state and federal agencies. In addition, we will help our clients address any questions from regulatory agencies regarding microscopy particle size analysis methods, data accuracy and robustness of the measurements.
Visit our Stack Sample Analysis page for more info on our stack emission analysis services.