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David is a chemist with a focus on material science. He has experience using polarized light microscopy (PLM) to identify and characterize a wide range of unknown materials, from types of asbestos to pharmaceutical contaminants. He also has experience characterizing material surface profiles using white light interference microscopy. In addition, he has a broad knowledge of other analytical instruments, including Fourier transform infrared spectroscopy (FTIR) and Raman spectroscopy, and is well-versed on a variety of sample preparation methods. He also serves as a member of the quality control unit (QCU).
EDUCATION:
- B.S., Chemistry, The Georgia Institute of Technology