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Matthew specializes in various sample preparation methods, including hand polishing and broad ion beam (BIB) polishing to prepare cross-sections for imaging, characterization, and particle size distribution using a scanning electron microscopy (SEM) with energy-dispersive x-ray spectroscopy (EDS). He also uses different types of light microscopy, such as brightfield/darkfield in reflected and transmitted light and differential interference contrast (DIC), along with SEM-EDS for failure analysis and material characterization. Matthew has experience in transmission electron microscopy (TEM) sample prep, including cryo-ultramicrotomy and asbestos filtration.