Particles are widely encountered in every industry, either as raw ingredients or as a contamination. In this 30 minute webinar, we will focus on the characterization of particle contamination. We will discuss the approaches and methodologies for isolation and analysis of foreign particles found in different products, processes and manufacturing facilities.
During this webinar, we will present an overview of SEM-EDS, optical microscopy, FTIR and Raman spectroscopy for characterizing particles and particle contamination. Case study examples will be presented showing the various approaches to particle characterization. After attending this webinar, the attendees will have an understanding of the different techniques applied to particle characterization.
Webinar
Highlighted Topics
Overview of particle characterization
Overview of instruments used for particle characterization
Application & case study examples for analyzing particle contamination
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