TEM Analysis Testing Services

TEM Analysis Testing Services
TEM analysis services offered at our lab include:

  • Particle morphology characterization
  • Particle internal structure analysis
  • Polymer cross-section characterization
  • Material identification by electron diffraction
  • Nanoparticle characterization
  • Environmental particulate identification
  • Cryo-ultramicrotomy prep for TEM imaging
  • High resolution TEM imaging
tem analysis of halloysite clay
Halloysite Clay
tem analysis of amphibole asbestos
Amphibole Asbestos
tem analysis of crocidolite crystalline lattice
Crocidolite Crystalline Lattice
tem analysis of a diatom
Diatom
tem analysis of clay and asbestos fibers
Clay and Asbestos Fibers
tem analysis of carbon soot
Carbon Soot
tem analysis of anodized aluminum
Anodized Aluminum
tem analysis of gunshot residue
Gunshot Residue
tem analysis of calcium cement
Low Calcium Cement
tem analysis of battery electrode cross section
Battery Electrode Cross Section
tem analysis of an embedded laser diode
Embedded Laser Diode
tem analysis of glass cross section
Glass Cross Section

The transmission electron microscope (TEM) is a versatile analytical microscope for material characterization. In a TEM, a very high-energy electron beam is placed on a sample that is thin enough to be partially electron transparent, and the electron “shadow” of the sample is viewed and digitally recorded.

TEM analysis provides valuable information on a material. High resolution imaging shows morphology, aggregate form and internal structure of particles and materials. In addition, the images of the particles can be used to measure the particle size distribution of the material.

With an energy dispersive x-ray spectrometer (EDS) coupled to a TEM, we can easily obtain elemental composition. In addition, our TEMs are also equipped with electron diffraction capability. With EDS and electron diffraction abilities, we can confidently identify an unknown material.

Sample preparation for TEM analysis is critical. Samples must be extremely thin or made extremely thin to allow for the electron beam to completely penetrate the sample. Depending on the composition of the sample, we utilize two thinning techniques for preparing TEM samples: ion milling and ultramicrotomy.

Using energy dispersive x-ray spectrometry, brightfield and darkfield imaging, and electron diffraction, our TEM analysis services are used to characterize and identify a wide range of materials.

TEM Analysis:
Video Overview by MVA

More info: TEM/EDS Electron Microscopy Lab Services