- Particle morphology characterization
- Particle internal structure analysis
- Polymer cross-section characterization
- Material identification by electron diffraction
- Nanoparticle characterization
- Environmental particulate identification
- Cryo-ultramicrotomy prep for TEM imaging
- High resolution TEM imaging
The transmission electron microscope (TEM) is a versatile analytical microscope for material characterization. In a TEM, a very high-energy electron beam is placed on a sample that is thin enough to be partially electron transparent, and the electron “shadow” of the sample is viewed and digitally recorded.
TEM analysis provides valuable information on a material. High resolution imaging shows morphology, aggregate form and internal structure of particles and materials. In addition, the images of the particles can be used to measure the particle size distribution of the material.
With an energy dispersive x-ray spectrometer (EDS) coupled to a TEM, we can easily obtain elemental composition. In addition, our TEMs are also equipped with electron diffraction capability. With EDS and electron diffraction abilities, we can confidently identify an unknown material.
Using energy dispersive x-ray spectrometry, brightfield and darkfield imaging, and electron diffraction, our TEM analysis services are used to characterize and identify a wide range of materials.
Video Overview by MVA
More info: TEM/EDS Electron Microscopy Lab Services