David is a chemist with a focus on material science. He has experience identifying and characterizing unknown materials using polarized light microscopy (PLM) and preparing samples for analysis using a scanning electron microscope (SEM). He also has experience characterizing material surface profiles using white light interference microscopy. In addition, he has a broad knowledge of other analytical instruments and techniques, including Fourier transform infrared spectroscopy (FTIR), nuclear magnetic resonance spectroscopy (NMR), and gas chromatography-mass spectrometry (GC-MS) for material identification and analysis. Prior to joining MVA, he worked in an organometallic synthesis research laboratory at the Georgia Institute of Technology and was a research associate for the Office of the Chief Scientist at the Defense Forensic Science Center. .
- B.S., Chemistry, The Georgia Institute of Technology, 2020.