Contaminant Particulate Analysis and Identification

MVA Scientific Consultants is writing a series of particulate analysis blog posts to address the most common questions that our clients ask us.

What is the purpose of analyzing particulate contaminant?
We analyze particles to identify their composition with the ultimate goal of determining the root cause or source of the particulate contaminant.

What analytical techniques does MVA Scientific Consultants use for particulate analysis?
MVA Scientific Consultants uses Fourier transform infrared spectroscopy (FTIR), scanning electron microscopy (SEM) combined with energy dispersive x-ray spectrometry (EDS), transmission electron microscopy (TEM), Raman spectroscopy and polarized light microscopy (PLM) to analyze foreign particulate contaminations.

What is the turnaround time for particulate analysis?
Our standard turnaround time is 10 business days. However, we understand that our clients may have emergency situations, so we offer two levels of expedited service. Our rush turnaround time is 3 to 5 business days, and emergency rush turnaround time is 1 to 2 business days. For an emergency rush we drop everything else we are working on and devote all resources to your project.

How much does it cost for contaminant particulate analysis?
We provide two basic tiers of contaminant particulate analyses. The price for cGMP contaminant particulate identification is $750 and the price for non-cGMP contaminant particulate identification is $625. If the particulate is not isolated from a medium or matrix, the price for isolation and identification varies depending on the complexity of the matrix.

Can we use MVA’s data for our submissions to regulatory agencies?
Yes, you will receive a detailed report of our analyses for each project.

How much sample do you need for contaminant particulate analysis?
This varies depending on how many analytical techniques we use. In most cases, if you can see the particulate, it will be enough for the analysis.

Click here for more information on contaminant particulate analysis and identification.