MVA Scientific Consultants provides ongoing investigative analytical testing services for a wide spectrum of industries. We work with pharmaceutical companies, medical devices manufacturers, beauty products manufacturers, food and beverage manufacturers, industrial hygienists, engineering firms, environmental consulting firms and many more. We also work with other analytical labs.
For more information please email us at info@mvainc.com.
By using microscopy and spectroscopy we are able to provide answers to many types of questions:
- What is the composition of this material?
- What is the shape of the particles?
- What is this contamination and where did it come from?
- Is this corrosion?
- What caused the corrosion?
- What is the particle size distribution of this material?
- Why is my product out of specification?
- What is the surface structure of this material?
- Did these particles originate from the same source?
- Does this product contain asbestos?
- Is this surface smooth?
Microscopy is an analytical technique that uses microscopes to magnify objects or details that are too small to be seen with the naked eye. We use optical and electron microscopy to identify and characterize specimens. Optical microscopy uses light to illuminate a specimen and a system of lenses to magnify it. Electron microscopy uses electron to illuminate a specimen and create a magnified image.
Spectroscopy is an analytical technique that is used to obtain spectra produced when matter interacts with or emits electromagnetic radiation. The spectra are used to identify and characterize specimens. Different spectra correspond to different materials.
If you are an analytical lab, partnering with MVA will allow you to expand the testing services that you offer. We can assist with sample preparation, optical microscopy, electron microscopy services, spectroscopy, method development, and feasibility studies. We are reliable and confidential.
We can help you help your clients.
- Particle characterization
- Particle size distribution
- Material characterization
- Product failure analysis
- Root cause analysis
- Coating analysis
- Corrosion analysis
- Surface profile characterization
- Polymer characterization
- Nanomaterial characterization
- Microscopy imaging
- Contamination analysis
- High resolution SEM & TEM imaging
- Optical microscopy
- Polarized light microscopy
- Phase contrast microscopy
- Fluorescence microscopy
- Scanning electron microscopy
- Transmission electron microscopy
- Energy dispersive x-ray spectrometry
- Scanning white light interference microscopy
- Differential interference contrast microscopy
- Fourier transform infrared spectroscopy
- Raman spectroscopy
- Raman chemical imaging
- Ion milling and microtomy